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Atomic Force Microscopy

Particular emphasis is laid on using the atomic force microscope (AFM) as an advanced multipurpose tool to probe not only the nanometre-scale morphology but also the nanomechanical, physicochemical, adhesive and frictional properties of surfaces, thin films, coatings, nanostructures and nanomaterials for both fundamental studies and applications (chemical industry, manufacturing, biotechnology & biomedicine, micro/nanoelectronics).

Atomic Force Microscopy: Research

+441316508704

Institute for Materials and Processes
School of Engineering
The University of Edinburgh
Sanderson Building
The King's Buildings
Robert Stevenson Road
EDINBURGH EH9 3FB
United Kingdom

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